Product
K&W
Material Testing
Tensil&compression module
- EBSD compatible.
- Deformation device for the scanning elctron microscope that fits on the specimen
- Stage like a large specimen.
- For specimens from 30 to 60 mm length, up to 10mm wide and up to 4mm high.
- Large travel range of 40mm
- Allows force-displacement diagrams.
- Computer controlled microprocessor unit with extensive software package.
- One System for all kind of materials and load rages
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